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Structure of (ZrO2)x(SiO2)1-x xerogels (x = 0.1, 0.2, 0.3 and 0.4) from FTIR, 29Si and 17O MAS NMR and EXAFS

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Bibliographic Details
Published in:Physical chemistry chemical physics : PCCP 1999, Vol.1 (10), p.2527-2533
Main Authors: PICKUP, D. M, MOUNTJOY, G, WALLIDGE, G. W, NEWPORT, R. J, SMITH, M. E
Format: Article
Language:English
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ISSN:1463-9076
1463-9084
DOI:10.1039/a901401b