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Structure of (Ta2O5)x(SiO2)1-x xerogels (x = 0.05, 0.11, 0.18, 0.25 and 1.0) from FTIR, 29Si and 17O MAS NMR and EXAFS

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Bibliographic Details
Published in:Journal of materials chemistry 2000, Vol.10 (8), p.1887-1894
Main Authors: PICKUP, D. M, MOUNTJOY, G, HOLLAND, M. A, WALLIDGE, G. W, NEWPORT, R, SMITH, M. E
Format: Article
Language:English
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ISSN:0959-9428
1364-5501
DOI:10.1039/b000947o