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Structure of (Ta2O5)x(SiO2)1-x xerogels (x = 0.05, 0.11, 0.18, 0.25 and 1.0) from FTIR, 29Si and 17O MAS NMR and EXAFS
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Published in: | Journal of materials chemistry 2000, Vol.10 (8), p.1887-1894 |
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Main Authors: | , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that cite this one |
Online Access: | Get full text |
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ISSN: | 0959-9428 1364-5501 |
DOI: | 10.1039/b000947o |