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On the advantages of the use of the three-element detector system for measuring EDXRD patterns to follow the crystallisation of open-framework structures
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Published in: | Physical chemistry chemical physics : PCCP 2000-01, Vol.2 (15), p.3523-3527 |
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Main Authors: | , , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that cite this one |
Online Access: | Get full text |
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ISSN: | 1463-9076 1463-9084 |
DOI: | 10.1039/b004171h |