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On the advantages of the use of the three-element detector system for measuring EDXRD patterns to follow the crystallisation of open-framework structures

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Bibliographic Details
Published in:Physical chemistry chemical physics : PCCP 2000-01, Vol.2 (15), p.3523-3527
Main Authors: MUNCASTER, G, DAVIES, A. T, SANKAR, G, CATLOW, C. R. A, THOMAS, J. M, COLSTON, S. L, BARNES, P, WALTON, R. I, O'HARE, D
Format: Article
Language:English
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ISSN:1463-9076
1463-9084
DOI:10.1039/b004171h