Characterization of organic-inorganic multilayer films by cyclic voltammetry, UV-Vis spectrometry, X-ray photoelectron spectroscopy, small-angle X-ray diffraction and electrochemical impedance spectroscopy

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Bibliographic Details
Published in:Journal of materials chemistry 2002-05, Vol.12 (6), p.1724-1729
Main Authors: Cheng, Zhiliang, Cheng, Long, Gao, Qiang, Dong, Shaojun, Yang, Xiurong
Format: Article
Language:English
Subjects:
Applied sciences
Composites
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science
rheology
Electrodeposition, electroplating
Exact sciences and technology
Forms of application and semi-finished materials
Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties
Materials science
Methods of deposition of films and coatings
film growth and epitaxy
Physics
Polymer industry, paints, wood
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Technology of polymers
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ISSN:0959-9428
1364-5501
DOI:10.1039/b200035k