A Test Case Generation Approach Based on Sequence Diagram and Automata Models

• Published in: Chinese Journal of Electronics 2016-03, Vol.25 (2), p.234-240
• Main Authors: Zhang, Chen, Duan, Zhenhua, Yu, Bin, Tian, Cong, Ding, Ming
• Format: Article
• Language: English
• Subjects: automata models; deterministic automata; ETDFA; event deterministic finite automata; finite automata; incremental test case generation approach; Model based testing; model checking; PPTL; program testing; program verification; propositional projection temporal logic; sequence diagram; software development process; synthesis rules; system interaction sequence diagram models; temporal logic; test automation; Test cases; test cases correctness; test cases generation process complexity reduction; test cases generation technology; Test model; Test scenario; 描述系统; 时序图; 测试用例生成; 生成方法; 确定有限自动机; 自动化测试; 自动机模型; 软件开发过程
• ISSN: 1022-4653; 2075-5597
• DOI: 10.1049/cje.2016.03.007

To improve the test automation in software development process, following the researches on test cases generation technology from models, an incremental test case generation approach is proposed based on finite automata, and Event deterministic finite automata (ETDFA) are employed to describe the sequence diagram models of system interaction. By model checked with Propositional projection temporal logic (PPTL), the correctness of ETDFA is verified. Then we can get the composed automata by synthesis rules, and generate the test cases incrementally by test cases generation algorithm. Case studies are presented to show that this approach enables to improve test cases correctness, and reduce the complexity of test cases generation process.