A Reflectron Time-of-Flight Mass Spectrometer with a Nano-Electrospray Ionization Source for Study of Metal Cluster Compounds

An experiment facility has been set up for the study of metal cluster compounds in our laboratory, which consists of a nano-electrospray ionization source, an ion transmission and focus system, and a reflectron time-of-flight mass spectrometer. Taking advantage of the nano-electrospray ionization so...

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Published in:Chinese journal of chemical physics 2016-08, Vol.29 (4), p.401-406
Main Authors: Wu, Xiao-hu, Xie, Hua, Liu, Zhi-ling, Su, Hai-feng, Lin, Shui-chao, Tang, Zi-chao
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container_title Chinese journal of chemical physics
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Xie, Hua
Liu, Zhi-ling
Su, Hai-feng
Lin, Shui-chao
Tang, Zi-chao
description An experiment facility has been set up for the study of metal cluster compounds in our laboratory, which consists of a nano-electrospray ionization source, an ion transmission and focus system, and a reflectron time-of-flight mass spectrometer. Taking advantage of the nano-electrospray ionization source, polyvalent ions are usually produced in the “ionization” process and the obtained mass resolution of the equipment is over 8000. The molecular ion peaks of metal cluster compounds [Au20(PPhpy2)10Cl2](SbF6)4, where PPhpy2=bis(2-pyridyl)phenylphosphine, and [Au6Ag2(C)L6](BF4)4, where L=2-(diphenylphosphino)-5-methylpyridine, are distinguished in the respective mass spectrum, accompanied by some fragment ion peaks. In addition, the mass-to-charge ratios of the parent ions are determinated. Preliminary results suggest that the device is a powerful tool for the study of metal cluster compounds. It turns out that the information obtained by the instrumentation serves as an essential supplement to single crystal X-ray diffraction for structure characterization of metal cluster compounds.
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title A Reflectron Time-of-Flight Mass Spectrometer with a Nano-Electrospray Ionization Source for Study of Metal Cluster Compounds
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