Limits of imaging resolution for atomic force microscopy of molecules

The imaging resolution of an atomic force microscope operating in contact with a Langmuir–Blodgett (LB) film is predicted as a function of applied force, tip radius, adhesive force, and tip and film properties. The elastic modulus and the hardness of the LB film were measured using a nanoindenter an...

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Bibliographic Details
Published in:Applied physics letters 1991-12, Vol.59 (27), p.3536-3538
Main Authors: WEIHS, T. P, NAWAS, S, JARVIS, S. P, PETHICA, J. B
Format: Article
Language:English
Subjects:
Cross-disciplinary physics: materials science
rheology
Exact sciences and technology
Materials science
Methods of crystal growth
physics of crystal growth
Physics
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Summary:The imaging resolution of an atomic force microscope operating in contact with a Langmuir–Blodgett (LB) film is predicted as a function of applied force, tip radius, adhesive force, and tip and film properties. The elastic modulus and the hardness of the LB film were measured using a nanoindenter and the imaging resolution is predicted using both a simple Hertzian elastic analysis and one that includes adhesive forces between the tip and the sample. For a small applied force (
ISSN:0003-6951
1077-3118
DOI:10.1063/1.105649