Surface-enhanced Raman scattering of amorphous silicon-carbon films

Surface-enhanced Raman scattering has been used to study the surface of magnetron sputtered amorphous silicon-carbon alloys applying the silver overlayer method. The presence of clusters from the sputtered material and different types of carbon–carbon bond configurations has been detected on the fil...

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Bibliographic Details
Published in:Applied physics letters 1993-05, Vol.62 (19), p.2396-2398
Main Authors: TZOLOV, M. B, TZENOV, N. V, DIMOVA-MALINOVSKA, D. I, YANKOV, D. Y
Format: Article
Language:English
Subjects:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Exact sciences and technology
Infrared and raman spectra and scattering
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Physics
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Summary:Surface-enhanced Raman scattering has been used to study the surface of magnetron sputtered amorphous silicon-carbon alloys applying the silver overlayer method. The presence of clusters from the sputtered material and different types of carbon–carbon bond configurations has been detected on the film surface. It has been shown that structural transformations which are not related to the hydrogen in the plasma take place on the surface.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.109376