Microwave measurement of the dielectric constant of Sr0.5Ba0.5TiO3 ferroelectric thin films

Measurement of the relative dielectric constant of a Sr0.5Ba0.5TiO3 (SBT) thin film is presented as a function of electric field strength and temperature over a broad frequency range using a microstrip transmission line. The transmission line was fabricated from a trilayer structure where the SBT fi...

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Bibliographic Details
Published in:Applied physics letters 1993-04, Vol.62 (15), p.1845-1847
Main Authors: CARROLL, K. R, POND, J. M, CHRISEY, D. B, HORWITZ, J. S, LEUCHTNER, R. E, GRABOWSKI, K. S
Format: Article
Language:English
Subjects:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Dielectric properties of solids and liquids
Dielectrics, piezoelectrics, and ferroelectrics and their properties
Exact sciences and technology
Permittivity (dielectric function)
Physics
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Summary:Measurement of the relative dielectric constant of a Sr0.5Ba0.5TiO3 (SBT) thin film is presented as a function of electric field strength and temperature over a broad frequency range using a microstrip transmission line. The transmission line was fabricated from a trilayer structure where the SBT film, grown by pulsed laser deposition, was bounded by silver and platinum metallization layers. Such structures involving ferroelectric films could be useful for microwave applications because of the substantially smaller bias voltages (≊1–10 V) compared to those required for bulk material. The SBT film was found to exhibit a dielectric constant of ≊120–250 and a large electric field modulation of ≊50% at 200 kV/cm. These properties of the material as well as the Curie temperature are compared to those of bulk SBT.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.109522