Atomic resolution scanning tunneling microscopy with a gallium arsenide tip

A scanning tunneling microscope which uses a gallium arsenide tip has been successfully constructed. Atomic resolution is demonstrated by the imaging of the Si(111)-7×7 surface in ultrahigh vacuum. Details of the tip preparation are given and the tip tunneling current characteristics are discussed.

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Bibliographic Details
Published in:Applied physics letters 1993-09, Vol.63 (13), p.1851-1853
Main Authors: NUNES, G. JR, AMER, N. M
Format: Article
Language:English
Subjects:
Electron, positron and ion microscopes, electron diffractometers and related techniques
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Physics
Scanning probe microscopes, components, and techniques
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Description
Summary:A scanning tunneling microscope which uses a gallium arsenide tip has been successfully constructed. Atomic resolution is demonstrated by the imaging of the Si(111)-7×7 surface in ultrahigh vacuum. Details of the tip preparation are given and the tip tunneling current characteristics are discussed.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.110654