Measurement of the complex nonlinear refractive index of single crystal p -toluene sulfonate at 1064 nm

Z-scan at 1064 nm was used with single, 35 ps pulses to measure the nonlinear refraction and absorption in single crystal PTS (p-toluene sulfonate). Detailed analysis of the Z-scan data based on Δn=n2I+n3I2 and Δα=α2I+α3I2 yielded n2=5(±1)×10−12 cm2/W, α2=100(±20) cm/GW, n3=−5(±1)×10−21 cm4/W2 and α...

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Bibliographic Details
Published in:Applied physics letters 1994-05, Vol.64 (21), p.2773-2775
Main Authors: Lawrence, Brian L., Cha, Myoungsik, Torruellas, William E., Stegeman, George I., Etemad, Shahab, Baker, Gregory, Kajzar, François
Format: Article
Language:English
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Summary:Z-scan at 1064 nm was used with single, 35 ps pulses to measure the nonlinear refraction and absorption in single crystal PTS (p-toluene sulfonate). Detailed analysis of the Z-scan data based on Δn=n2I+n3I2 and Δα=α2I+α3I2 yielded n2=5(±1)×10−12 cm2/W, α2=100(±20) cm/GW, n3=−5(±1)×10−21 cm4/W2 and α3=−5(±1) cm3/GW.2 The resulting two photon figure of merit T for PTS is marginal for high throughput, all-optical waveguide switching at 1064 nm.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.111466