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More efficient channel electron multiplier by coating of the cone with a high secondary electron yield material
The efficiency of channel electron multipliers (CEM) falls drastically at energies of the incident electrons greater than a few KeV. For conversion Electron Mössbauer Spectroscopy (CEMS) the conversion electron energies are far greater than a few KeV, and the CEM efficiency at 7 KeV, for example, is...
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Published in: | Review of scientific instruments 1981-10, Vol.52 (10), p.1490-1492 |
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Main Authors: | , , |
Format: | Article |
Language: | English |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The efficiency of channel electron multipliers (CEM) falls drastically at energies of the incident electrons greater than a few KeV. For conversion Electron Mössbauer Spectroscopy (CEMS) the conversion electron energies are far greater than a few KeV, and the CEM efficiency at 7 KeV, for example, is about 10% determined in our laboratory. The efficiency can be improved by increasing the secondary electron yield of the detector cone. To find a coating material, a study of relative secondary electron yields was carried out using a scanning microscope. The results of the study indicate that the detector efficiency should improve by more than a factor of 3 when the cone is coated with MgO. Experimentally, the efficiency of the coated detector is in fact more than 3 times that of the uncoated detector. |
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ISSN: | 0034-6748 1089-7623 |
DOI: | 10.1063/1.1136481 |