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Phase response measurement technique for waveguide grating filters

A simple interferometric technique is described which can be used to accurately measure the phase response of waveguide grating filters. A narrowband, tunable Ti:sapphire laser is used in a Michelson interferometer configuration, where light reflected from a waveguide grating filter is combined with...

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Bibliographic Details
Published in:Applied physics letters 1995-04, Vol.66 (17), p.2168-2170
Main Authors: Brooks, Cameron J., Vossler, Gerald L., Winick, Kim A.
Format: Article
Language:English
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Description
Summary:A simple interferometric technique is described which can be used to accurately measure the phase response of waveguide grating filters. A narrowband, tunable Ti:sapphire laser is used in a Michelson interferometer configuration, where light reflected from a waveguide grating filter is combined with a reference beam. The intensity of the combined beams is measured as the wavelength of the Ti:sapphire laser is tuned. The measured intensity exhibits a quasisinusoidal wavelength dependence, from which the phase response of the filter can be deduced. This method is successfully demonstrated using both an integrated optic waveguide grating filter and a bulk grating pair.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.113935