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Phase response measurement technique for waveguide grating filters
A simple interferometric technique is described which can be used to accurately measure the phase response of waveguide grating filters. A narrowband, tunable Ti:sapphire laser is used in a Michelson interferometer configuration, where light reflected from a waveguide grating filter is combined with...
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Published in: | Applied physics letters 1995-04, Vol.66 (17), p.2168-2170 |
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Main Authors: | , , |
Format: | Article |
Language: | English |
Citations: | Items that cite this one |
Online Access: | Get full text |
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Summary: | A simple interferometric technique is described which can be used to accurately measure the phase response of waveguide grating filters. A narrowband, tunable Ti:sapphire laser is used in a Michelson interferometer configuration, where light reflected from a waveguide grating filter is combined with a reference beam. The intensity of the combined beams is measured as the wavelength of the Ti:sapphire laser is tuned. The measured intensity exhibits a quasisinusoidal wavelength dependence, from which the phase response of the filter can be deduced. This method is successfully demonstrated using both an integrated optic waveguide grating filter and a bulk grating pair. |
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ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.113935 |