Improved microwave test fixture for brittle substrate materials

A microwave test fixture has been designed and built to hold brittle substrate materials, such as GaAs, without inducing damage. The substrate pressure is adjustable and easily controlled by the use of compression springs. Tests have shown that the holder does not damage GaAs substrates, and produce...

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Bibliographic Details
Published in:Review of scientific instruments 1989-03, Vol.60 (3), p.495-498
Main Authors: McGregor, Douglas S., Weichold, Mark H.
Format: Article
Language:English
Subjects:
Applied sciences
Electronics
Exact sciences and technology
Testing, measurement, noise and reliability
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Summary:A microwave test fixture has been designed and built to hold brittle substrate materials, such as GaAs, without inducing damage. The substrate pressure is adjustable and easily controlled by the use of compression springs. Tests have shown that the holder does not damage GaAs substrates, and produces repeatable and reliable measurements.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1140407