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Measurements of x‐ray diffraction for liquid metals under high pressure
By using synchrotron radiation with high brightness, high energy, and continuous spectrum in energy, x‐ray diffraction for liquid metals has been measured at pressures to 9 GPa and temperatures to 800 °C by a transmitting and energy‐dispersive method. A cubic‐type apparatus for high‐pressure and hig...
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Published in: | Review of Scientific Instruments 1989-07, Vol.60 (7), p.2425-2428 |
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Main Authors: | , , , , |
Format: | Article |
Language: | English |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | By using synchrotron radiation with high brightness, high energy, and continuous spectrum in energy, x‐ray diffraction for liquid metals has been measured at pressures to 9 GPa and temperatures to 800 °C by a transmitting and energy‐dispersive method. A cubic‐type apparatus for high‐pressure and high‐temperature experiments was used. A thick specimen could be used as the absorption coefficient was small for high energy x rays (40–120 keV). A sharp slit system eliminated the background intensity from the pressure‐transmitting medium and the sample container. This method has been applied to the investigation of pressure‐induced structural changes in liquid selenium, gallium, and bismuth. |
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ISSN: | 0034-6748 1089-7623 |
DOI: | 10.1063/1.1140736 |