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An x‐ray spectrometer for Compton scattering

An x‐ray spectrometer has been designed and constructed for Compton scattering measurements using 40–70 keV x‐rays from an ellipsoid multipole wiggler (EMPW) installed in the accumulation ring of the National Laboratory for High Energy Physics at Tsukuba. The spectrometer has four sets of a Cauchois...

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Bibliographic Details
Published in:Review of Scientific Instruments 1992-01, Vol.63 (1), p.1190-1193
Main Authors: Sakurai, Y., Ito, M., Urai, T., Tanaka, Y., Sakai, N., Iwazumi, T., Kawata, H., Ando, M., Shiotani, N.
Format: Article
Language:English
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Summary:An x‐ray spectrometer has been designed and constructed for Compton scattering measurements using 40–70 keV x‐rays from an ellipsoid multipole wiggler (EMPW) installed in the accumulation ring of the National Laboratory for High Energy Physics at Tsukuba. The spectrometer has four sets of a Cauchois‐type energy analyzer and an imaging plate, which are arranged on the surface of a cone and share a scattering angle of 160°. In each energy‐analyzing system, to increase signal to noise ratio a set of vertical and horizontal slits are inserted between the analyzer and the imaging plate. A resolution of 0.13 a.u. in terms of electron momentum was achieved. A Compton profile of a vanadium single crystal was measured with an integrated counting rate of 400 counts/s.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1143079