X‐ray reflection properties of annealed silicon single crystals

We present a series of x‐ray reflectivity measurements performed on annealed Czochralski grown silicon (ACS) crystals in the energy range E

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Bibliographic Details
Published in:Review of Scientific Instruments 1992-01, Vol.63 (1), p.907-910
Main Authors: Zaumseil, P., Winter, U., Joksch, St, Freund, A. K.
Format: Article
Language:English
Subjects:
Alloys
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Physics
Structure of solids and liquids
crystallography
Structure of specific crystalline solids
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Description
Summary:We present a series of x‐ray reflectivity measurements performed on annealed Czochralski grown silicon (ACS) crystals in the energy range E
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1143775