Very sharp platinum tips for scanning tunneling microscopy

To achieve both high stability for scanning tunneling microscopy (STM) measurements and well‐defined tunnel current localization even on very rough surfaces, we have developed a new electrochemical procedure using CaCl2 etching and H2SO4 micro polishing technique to obtain a very reproducible tip ge...

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Bibliographic Details
Published in:Review of scientific instruments 1995-01, Vol.66 (1), p.97-100
Main Authors: Libioulle, L., Houbion, Y., Gilles, J.‐M.
Format: Article
Language:English
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Summary:To achieve both high stability for scanning tunneling microscopy (STM) measurements and well‐defined tunnel current localization even on very rough surfaces, we have developed a new electrochemical procedure using CaCl2 etching and H2SO4 micro polishing technique to obtain a very reproducible tip geometry. The mean curvature radius is about 50 Å. The contamination‐free platinum tips are usable for a long time as well in air as in ultrahigh vacuum. The tip quality has been tested by STM measurements on gold (111) surfaces and on liquid‐crystal films. Tips are stable and provide good STM image in far less time than commonly used tips.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1146153