Measurement of the complex dielectric constant down to helium temperatures. II. Quasioptical technique from 0.03 to 1 THz

A quasioptical method is described that allows the determination of the complex dielectric constant almost continuously in the millimeter wave regime without the use of electrical contacts. The technique allows the dielectric properties of bulk samples (solids, powders, and liquids) and thin films (...

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Bibliographic Details
Published in:Review of scientific instruments 2000-02, Vol.71 (2), p.478-481
Main Authors: Reedijk, J. A., Martens, H. C. F., Smits, B. J. G., Brom, H. B.
Format: Article
Language:English
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Summary:A quasioptical method is described that allows the determination of the complex dielectric constant almost continuously in the millimeter wave regime without the use of electrical contacts. The technique allows the dielectric properties of bulk samples (solids, powders, and liquids) and thin films (free standing or deposited on a substrate) to be measured with excellent absolute accuracy down to 2 K.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1150227