Pulsed laser-induced desorption and optical imaging on a nanometer scale with scanning near-field microscopy using chemically etched fiber tips

Laser-induced desorption on a nanometer scale using scanning near-field optical microscopy (SNOM) is demonstrated. Pulsed laser-induced desorption of anthracene with completely metallized SNOM fiber tips resulted in a lateral resolution of 70 nm. This became possible due to the use of chemically etc...

Full description

Saved in:
Bibliographic Details
Published in:Applied physics letters 1996-04, Vol.68 (18), p.2491-2492
Main Authors: Zeisel, Dieter, Nettesheim, Stefan, Dutoit, Bertrand, Zenobi, Renato
Format: Article
Language:English
Citations: Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Laser-induced desorption on a nanometer scale using scanning near-field optical microscopy (SNOM) is demonstrated. Pulsed laser-induced desorption of anthracene with completely metallized SNOM fiber tips resulted in a lateral resolution of 70 nm. This became possible due to the use of chemically etched tips with a taper region smaller than 200 μm and cone angles varying from 6 to 30 degrees. These tips are further useful for optical imaging with a very high optical transmission coefficient (up to 10−3), achieving a lateral resolution of 80 nm.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.115831