Study of the leakage field of magnetic force microscopy thin-film tips using electron holography

Electron holography is applied for the study of the leakage field of thin-film ferromagnetic tips used as probes in magnetic force microscopy. We used commercially available pyramidal tips covered on one face with a thin NiCo film, which were then placed in a high external magnetic field directed al...

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Published in:Applied physics letters 1996-03, Vol.68 (13), p.1865-1867
Main Authors: Frost, B. G., van Hulst, N. F., Lunedei, E., Matteucci, G., Rikkers, E.
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Language:English
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container_end_page 1867
container_issue 13
container_start_page 1865
container_title Applied physics letters
container_volume 68
creator Frost, B. G.
van Hulst, N. F.
Lunedei, E.
Matteucci, G.
Rikkers, E.
description Electron holography is applied for the study of the leakage field of thin-film ferromagnetic tips used as probes in magnetic force microscopy. We used commercially available pyramidal tips covered on one face with a thin NiCo film, which were then placed in a high external magnetic field directed along the pyramid axis. Good agreement between simulated and experimental electron phase difference maps allows to measure the local flux from the ferromagnetic tips and therefore to evaluate the perturbation induced by the microprobe stray field on the sample area.
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title Study of the leakage field of magnetic force microscopy thin-film tips using electron holography
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