High resolution positron-annihilation spectroscopy with a new positron microprobe

In cooperation with Zeiss/LEO GmbH, a monoenergetic positron source has been integrated in the electron optical system of a scanning electron microscope by help of a magnetic prism. The electron optics serves both to image the specimen with electrons and to form a positron microbeam that allows loca...

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Bibliographic Details
Published in:Applied physics letters 1997-10, Vol.71 (15), p.2115-2117
Main Authors: Greif, H., Haaks, M., Holzwarth, U., Männig, U., Tongbhoyai, M., Wider, T., Maier, K., Bihr, J., Huber, B.
Format: Article
Language:English
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Summary:In cooperation with Zeiss/LEO GmbH, a monoenergetic positron source has been integrated in the electron optical system of a scanning electron microscope by help of a magnetic prism. The electron optics serves both to image the specimen with electrons and to form a positron microbeam that allows local positron-annihilation measurements with a resolution in the micron range. The fatigue damage profile along the cross section of a copper plate after a three-point bending test has been investigated. The obtained S-parameter profile coincides well with the expected fatigue damage distribution.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.120451