Effect of external stress on polarization in ferroelectric thin films

The polarization changes caused by applying mechanical stresses to a lead zirconate titanate (PZT) thin film were investigated. Both the remnant and spontaneous polarizations decreased when the PZT film was loaded with tensile stress. For compressive stresses, the remnant polarization increased, but...

Full description

Saved in:
Bibliographic Details
Published in:Applied physics letters 1998-02, Vol.72 (5), p.608-610
Main Authors: Kumazawa, Tetsuo, Kumagai, Yukihiro, Miura, Hideo, Kitano, Makoto, Kushida, Keiko
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c291t-399b2f175f6c55c42438743f08c04e1f6a6dc64f2e29dcc52da0133ff5576e293
cites cdi_FETCH-LOGICAL-c291t-399b2f175f6c55c42438743f08c04e1f6a6dc64f2e29dcc52da0133ff5576e293
container_end_page 610
container_issue 5
container_start_page 608
container_title Applied physics letters
container_volume 72
creator Kumazawa, Tetsuo
Kumagai, Yukihiro
Miura, Hideo
Kitano, Makoto
Kushida, Keiko
description The polarization changes caused by applying mechanical stresses to a lead zirconate titanate (PZT) thin film were investigated. Both the remnant and spontaneous polarizations decreased when the PZT film was loaded with tensile stress. For compressive stresses, the remnant polarization increased, but spontaneous polarization did not change. In fatigue with tensile stress state, the polarization decreased earlier than when there was no stress, which depend on whether or not the initial polarization value was high. Conversely, in fatigue with compressive stress, the initial higher remnant polarization value was maintained compared with the polarization in the unstress condition.
doi_str_mv 10.1063/1.120820
format article
fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_120820</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1063_1_120820</sourcerecordid><originalsourceid>FETCH-LOGICAL-c291t-399b2f175f6c55c42438743f08c04e1f6a6dc64f2e29dcc52da0133ff5576e293</originalsourceid><addsrcrecordid>eNotj01LxDAURYM4YJ0R_AlZuun4Xl6TtksZ6gcMuNF1iWkeRjrtkGSh_no7jKvLuXAvHCFuEbYIhu5xiwoaBReiQKjrkhCbS1EAAJWm1XglrlP6WlArokJ0HbN3Wc4s_Xf2cbKjTDn6lOQ8yeM82hh-bQ4LhEmyj3H24zKIwcn8earCeEgbsWI7Jn_zn2vx_ti97Z7L_evTy-5hXzrVYi6pbT8UY63ZOK1dpSpq6ooYGgeVRzbWDM5UrLxqB-e0GiwgEbPWtVk6Wou786-Lc0rRc3-M4WDjT4_Qn_R77M_69AdNY0xR</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Effect of external stress on polarization in ferroelectric thin films</title><source>AIP Digital Archive</source><source>AIP Journals (American Institute of Physics)</source><creator>Kumazawa, Tetsuo ; Kumagai, Yukihiro ; Miura, Hideo ; Kitano, Makoto ; Kushida, Keiko</creator><creatorcontrib>Kumazawa, Tetsuo ; Kumagai, Yukihiro ; Miura, Hideo ; Kitano, Makoto ; Kushida, Keiko</creatorcontrib><description>The polarization changes caused by applying mechanical stresses to a lead zirconate titanate (PZT) thin film were investigated. Both the remnant and spontaneous polarizations decreased when the PZT film was loaded with tensile stress. For compressive stresses, the remnant polarization increased, but spontaneous polarization did not change. In fatigue with tensile stress state, the polarization decreased earlier than when there was no stress, which depend on whether or not the initial polarization value was high. Conversely, in fatigue with compressive stress, the initial higher remnant polarization value was maintained compared with the polarization in the unstress condition.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.120820</identifier><language>eng</language><ispartof>Applied physics letters, 1998-02, Vol.72 (5), p.608-610</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c291t-399b2f175f6c55c42438743f08c04e1f6a6dc64f2e29dcc52da0133ff5576e293</citedby><cites>FETCH-LOGICAL-c291t-399b2f175f6c55c42438743f08c04e1f6a6dc64f2e29dcc52da0133ff5576e293</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,782,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Kumazawa, Tetsuo</creatorcontrib><creatorcontrib>Kumagai, Yukihiro</creatorcontrib><creatorcontrib>Miura, Hideo</creatorcontrib><creatorcontrib>Kitano, Makoto</creatorcontrib><creatorcontrib>Kushida, Keiko</creatorcontrib><title>Effect of external stress on polarization in ferroelectric thin films</title><title>Applied physics letters</title><description>The polarization changes caused by applying mechanical stresses to a lead zirconate titanate (PZT) thin film were investigated. Both the remnant and spontaneous polarizations decreased when the PZT film was loaded with tensile stress. For compressive stresses, the remnant polarization increased, but spontaneous polarization did not change. In fatigue with tensile stress state, the polarization decreased earlier than when there was no stress, which depend on whether or not the initial polarization value was high. Conversely, in fatigue with compressive stress, the initial higher remnant polarization value was maintained compared with the polarization in the unstress condition.</description><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1998</creationdate><recordtype>article</recordtype><recordid>eNotj01LxDAURYM4YJ0R_AlZuun4Xl6TtksZ6gcMuNF1iWkeRjrtkGSh_no7jKvLuXAvHCFuEbYIhu5xiwoaBReiQKjrkhCbS1EAAJWm1XglrlP6WlArokJ0HbN3Wc4s_Xf2cbKjTDn6lOQ8yeM82hh-bQ4LhEmyj3H24zKIwcn8earCeEgbsWI7Jn_zn2vx_ti97Z7L_evTy-5hXzrVYi6pbT8UY63ZOK1dpSpq6ooYGgeVRzbWDM5UrLxqB-e0GiwgEbPWtVk6Wou786-Lc0rRc3-M4WDjT4_Qn_R77M_69AdNY0xR</recordid><startdate>19980202</startdate><enddate>19980202</enddate><creator>Kumazawa, Tetsuo</creator><creator>Kumagai, Yukihiro</creator><creator>Miura, Hideo</creator><creator>Kitano, Makoto</creator><creator>Kushida, Keiko</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19980202</creationdate><title>Effect of external stress on polarization in ferroelectric thin films</title><author>Kumazawa, Tetsuo ; Kumagai, Yukihiro ; Miura, Hideo ; Kitano, Makoto ; Kushida, Keiko</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c291t-399b2f175f6c55c42438743f08c04e1f6a6dc64f2e29dcc52da0133ff5576e293</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1998</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kumazawa, Tetsuo</creatorcontrib><creatorcontrib>Kumagai, Yukihiro</creatorcontrib><creatorcontrib>Miura, Hideo</creatorcontrib><creatorcontrib>Kitano, Makoto</creatorcontrib><creatorcontrib>Kushida, Keiko</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kumazawa, Tetsuo</au><au>Kumagai, Yukihiro</au><au>Miura, Hideo</au><au>Kitano, Makoto</au><au>Kushida, Keiko</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Effect of external stress on polarization in ferroelectric thin films</atitle><jtitle>Applied physics letters</jtitle><date>1998-02-02</date><risdate>1998</risdate><volume>72</volume><issue>5</issue><spage>608</spage><epage>610</epage><pages>608-610</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><abstract>The polarization changes caused by applying mechanical stresses to a lead zirconate titanate (PZT) thin film were investigated. Both the remnant and spontaneous polarizations decreased when the PZT film was loaded with tensile stress. For compressive stresses, the remnant polarization increased, but spontaneous polarization did not change. In fatigue with tensile stress state, the polarization decreased earlier than when there was no stress, which depend on whether or not the initial polarization value was high. Conversely, in fatigue with compressive stress, the initial higher remnant polarization value was maintained compared with the polarization in the unstress condition.</abstract><doi>10.1063/1.120820</doi><tpages>3</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0003-6951
ispartof Applied physics letters, 1998-02, Vol.72 (5), p.608-610
issn 0003-6951
1077-3118
language eng
recordid cdi_crossref_primary_10_1063_1_120820
source AIP Digital Archive; AIP Journals (American Institute of Physics)
title Effect of external stress on polarization in ferroelectric thin films
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-04T12%3A49%3A06IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Effect%20of%20external%20stress%20on%20polarization%20in%20ferroelectric%20thin%20films&rft.jtitle=Applied%20physics%20letters&rft.au=Kumazawa,%20Tetsuo&rft.date=1998-02-02&rft.volume=72&rft.issue=5&rft.spage=608&rft.epage=610&rft.pages=608-610&rft.issn=0003-6951&rft.eissn=1077-3118&rft_id=info:doi/10.1063/1.120820&rft_dat=%3Ccrossref%3E10_1063_1_120820%3C/crossref%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c291t-399b2f175f6c55c42438743f08c04e1f6a6dc64f2e29dcc52da0133ff5576e293%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true