Local optical spectroscopy of self-assembled quantum dots using a near-field optical fiber probe to induce a localized strain field

We introduce and demonstrate a novel operating mode in near-field optical microscopy. The tip is used to simultaneously optically probe the sample and induce a highly localized strain in the area under study by pushing the tip into the sample. From knowledge of total tip-sample compression and tip g...

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Bibliographic Details
Published in:Applied physics letters 1998-04, Vol.72 (17), p.2081-2083
Main Authors: Robinson, H. D., Müller, M. G., Goldberg, B. B., Merz, J. L.
Format: Article
Language:English
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Summary:We introduce and demonstrate a novel operating mode in near-field optical microscopy. The tip is used to simultaneously optically probe the sample and induce a highly localized strain in the area under study by pushing the tip into the sample. From knowledge of total tip-sample compression and tip geometry, we estimate the magnitude of stress, and show that localized uniaxial-like stresses in excess of 10 kbar can be achieved. We apply this method to a sample of InAlAs self-assembled quantum dots. A blueshift of quantum dot emission lines consistent with estimates of the strain is observed, as well as a quenching of the photoluminescence with strain.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.121282