Degradation processes at the cathode/organic interface in organic light emitting devices with Mg:Ag cathodes

We report electroluminescence degradation studies on tris(8-hydroxyquinoline) aluminum (Alq3)-based organic light emitting devices (OLEDs) with Mg:Ag cathodes in ambient conditions. The nonemissive spots in the OLEDs are studied via optical and fluorescence microscopy and via microscopic infrared sp...

Full description

Saved in:
Bibliographic Details
Published in:Applied physics letters 1998-05, Vol.72 (21), p.2642-2644
Main Authors: Aziz, Hany, Popovic, Zoran, Tripp, Carl P., Hu, Nan-Xing, Hor, Ah-Mee, Xu, Gu
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c225t-8439d64aec1532e770520bc7b854635d5c124fe1f23403b03c8162e5e0e4c23a3
cites cdi_FETCH-LOGICAL-c225t-8439d64aec1532e770520bc7b854635d5c124fe1f23403b03c8162e5e0e4c23a3
container_end_page 2644
container_issue 21
container_start_page 2642
container_title Applied physics letters
container_volume 72
creator Aziz, Hany
Popovic, Zoran
Tripp, Carl P.
Hu, Nan-Xing
Hor, Ah-Mee
Xu, Gu
description We report electroluminescence degradation studies on tris(8-hydroxyquinoline) aluminum (Alq3)-based organic light emitting devices (OLEDs) with Mg:Ag cathodes in ambient conditions. The nonemissive spots in the OLEDs are studied via optical and fluorescence microscopy and via microscopic infrared spectroscopy. Studies reveal that a majority of the nonemissive spots are caused by the growth of Mg(OH)2 sites at the Alq3/Mg:Ag interface, associated with local degradation of the Alq3 layer. In addition, the growth of elevated cathode bubbles, which also lead to nonemissive spots, is found to be caused by gas evolution from the galvanic corrosion of the Mg/Ag couple as well as from the electrolysis of absorbed moisture.
doi_str_mv 10.1063/1.121442
format article
fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_121442</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1063_1_121442</sourcerecordid><originalsourceid>FETCH-LOGICAL-c225t-8439d64aec1532e770520bc7b854635d5c124fe1f23403b03c8162e5e0e4c23a3</originalsourceid><addsrcrecordid>eNo1kE9LwzAYxoMoOKfgR8jRS7e8eZO28zamU2HiRc8lTd-mka4dSVD89lbmTs-fw4-Hh7FbEAsQOS5hARKUkmdsBqIoMgQoz9lMCIFZvtJwya5i_Jyilogz1j-QC6YxyY8DP4TRUowUuUk8dcStSd3Y0HIMzgzecj8kCq2xNDl-KnvvusRp71Pyg-MNffmJwr996viru1-7EyZes4vW9JFu_nXOPraP75vnbPf29LJZ7zIrpU5ZqXDV5MqQBY2SimLaKmpb1KVWOepGW5CqJWglKoG1QFtCLkmTIGUlGpyzuyPXhjHGQG11CH5vwk8Fovp7qYLq-BL-AuJqWd4</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Degradation processes at the cathode/organic interface in organic light emitting devices with Mg:Ag cathodes</title><source>AIP Digital Archive</source><source>AIP Journals (American Institute of Physics)</source><creator>Aziz, Hany ; Popovic, Zoran ; Tripp, Carl P. ; Hu, Nan-Xing ; Hor, Ah-Mee ; Xu, Gu</creator><creatorcontrib>Aziz, Hany ; Popovic, Zoran ; Tripp, Carl P. ; Hu, Nan-Xing ; Hor, Ah-Mee ; Xu, Gu</creatorcontrib><description>We report electroluminescence degradation studies on tris(8-hydroxyquinoline) aluminum (Alq3)-based organic light emitting devices (OLEDs) with Mg:Ag cathodes in ambient conditions. The nonemissive spots in the OLEDs are studied via optical and fluorescence microscopy and via microscopic infrared spectroscopy. Studies reveal that a majority of the nonemissive spots are caused by the growth of Mg(OH)2 sites at the Alq3/Mg:Ag interface, associated with local degradation of the Alq3 layer. In addition, the growth of elevated cathode bubbles, which also lead to nonemissive spots, is found to be caused by gas evolution from the galvanic corrosion of the Mg/Ag couple as well as from the electrolysis of absorbed moisture.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.121442</identifier><language>eng</language><ispartof>Applied physics letters, 1998-05, Vol.72 (21), p.2642-2644</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c225t-8439d64aec1532e770520bc7b854635d5c124fe1f23403b03c8162e5e0e4c23a3</citedby><cites>FETCH-LOGICAL-c225t-8439d64aec1532e770520bc7b854635d5c124fe1f23403b03c8162e5e0e4c23a3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,777,779,781,27905,27906</link.rule.ids></links><search><creatorcontrib>Aziz, Hany</creatorcontrib><creatorcontrib>Popovic, Zoran</creatorcontrib><creatorcontrib>Tripp, Carl P.</creatorcontrib><creatorcontrib>Hu, Nan-Xing</creatorcontrib><creatorcontrib>Hor, Ah-Mee</creatorcontrib><creatorcontrib>Xu, Gu</creatorcontrib><title>Degradation processes at the cathode/organic interface in organic light emitting devices with Mg:Ag cathodes</title><title>Applied physics letters</title><description>We report electroluminescence degradation studies on tris(8-hydroxyquinoline) aluminum (Alq3)-based organic light emitting devices (OLEDs) with Mg:Ag cathodes in ambient conditions. The nonemissive spots in the OLEDs are studied via optical and fluorescence microscopy and via microscopic infrared spectroscopy. Studies reveal that a majority of the nonemissive spots are caused by the growth of Mg(OH)2 sites at the Alq3/Mg:Ag interface, associated with local degradation of the Alq3 layer. In addition, the growth of elevated cathode bubbles, which also lead to nonemissive spots, is found to be caused by gas evolution from the galvanic corrosion of the Mg/Ag couple as well as from the electrolysis of absorbed moisture.</description><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1998</creationdate><recordtype>article</recordtype><recordid>eNo1kE9LwzAYxoMoOKfgR8jRS7e8eZO28zamU2HiRc8lTd-mka4dSVD89lbmTs-fw4-Hh7FbEAsQOS5hARKUkmdsBqIoMgQoz9lMCIFZvtJwya5i_Jyilogz1j-QC6YxyY8DP4TRUowUuUk8dcStSd3Y0HIMzgzecj8kCq2xNDl-KnvvusRp71Pyg-MNffmJwr996viru1-7EyZes4vW9JFu_nXOPraP75vnbPf29LJZ7zIrpU5ZqXDV5MqQBY2SimLaKmpb1KVWOepGW5CqJWglKoG1QFtCLkmTIGUlGpyzuyPXhjHGQG11CH5vwk8Fovp7qYLq-BL-AuJqWd4</recordid><startdate>19980525</startdate><enddate>19980525</enddate><creator>Aziz, Hany</creator><creator>Popovic, Zoran</creator><creator>Tripp, Carl P.</creator><creator>Hu, Nan-Xing</creator><creator>Hor, Ah-Mee</creator><creator>Xu, Gu</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19980525</creationdate><title>Degradation processes at the cathode/organic interface in organic light emitting devices with Mg:Ag cathodes</title><author>Aziz, Hany ; Popovic, Zoran ; Tripp, Carl P. ; Hu, Nan-Xing ; Hor, Ah-Mee ; Xu, Gu</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c225t-8439d64aec1532e770520bc7b854635d5c124fe1f23403b03c8162e5e0e4c23a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1998</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Aziz, Hany</creatorcontrib><creatorcontrib>Popovic, Zoran</creatorcontrib><creatorcontrib>Tripp, Carl P.</creatorcontrib><creatorcontrib>Hu, Nan-Xing</creatorcontrib><creatorcontrib>Hor, Ah-Mee</creatorcontrib><creatorcontrib>Xu, Gu</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Aziz, Hany</au><au>Popovic, Zoran</au><au>Tripp, Carl P.</au><au>Hu, Nan-Xing</au><au>Hor, Ah-Mee</au><au>Xu, Gu</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Degradation processes at the cathode/organic interface in organic light emitting devices with Mg:Ag cathodes</atitle><jtitle>Applied physics letters</jtitle><date>1998-05-25</date><risdate>1998</risdate><volume>72</volume><issue>21</issue><spage>2642</spage><epage>2644</epage><pages>2642-2644</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><abstract>We report electroluminescence degradation studies on tris(8-hydroxyquinoline) aluminum (Alq3)-based organic light emitting devices (OLEDs) with Mg:Ag cathodes in ambient conditions. The nonemissive spots in the OLEDs are studied via optical and fluorescence microscopy and via microscopic infrared spectroscopy. Studies reveal that a majority of the nonemissive spots are caused by the growth of Mg(OH)2 sites at the Alq3/Mg:Ag interface, associated with local degradation of the Alq3 layer. In addition, the growth of elevated cathode bubbles, which also lead to nonemissive spots, is found to be caused by gas evolution from the galvanic corrosion of the Mg/Ag couple as well as from the electrolysis of absorbed moisture.</abstract><doi>10.1063/1.121442</doi><tpages>3</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0003-6951
ispartof Applied physics letters, 1998-05, Vol.72 (21), p.2642-2644
issn 0003-6951
1077-3118
language eng
recordid cdi_crossref_primary_10_1063_1_121442
source AIP Digital Archive; AIP Journals (American Institute of Physics)
title Degradation processes at the cathode/organic interface in organic light emitting devices with Mg:Ag cathodes
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-19T20%3A36%3A49IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Degradation%20processes%20at%20the%20cathode/organic%20interface%20in%20organic%20light%20emitting%20devices%20with%20Mg:Ag%20cathodes&rft.jtitle=Applied%20physics%20letters&rft.au=Aziz,%20Hany&rft.date=1998-05-25&rft.volume=72&rft.issue=21&rft.spage=2642&rft.epage=2644&rft.pages=2642-2644&rft.issn=0003-6951&rft.eissn=1077-3118&rft_id=info:doi/10.1063/1.121442&rft_dat=%3Ccrossref%3E10_1063_1_121442%3C/crossref%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c225t-8439d64aec1532e770520bc7b854635d5c124fe1f23403b03c8162e5e0e4c23a3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true