Direct evidence of micropipe-related pure superscrew dislocations in SiC

A set of powerful x-ray imaging techniques using white-beam synchrotron radiation have been developed and applied to clearly reveal and map micropipes in SiC crystals at a “magnified” level. The experimental results and the corresponding simulations demonstrate explicitly that the micropipes are pur...

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Bibliographic Details
Published in:Applied physics letters 1999-01, Vol.74 (3), p.353-355
Main Authors: Huang, X. R., Dudley, M., Vetter, W. M., Huang, W., Wang, S., Carter, C. H.
Format: Article
Language:English
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Summary:A set of powerful x-ray imaging techniques using white-beam synchrotron radiation have been developed and applied to clearly reveal and map micropipes in SiC crystals at a “magnified” level. The experimental results and the corresponding simulations demonstrate explicitly that the micropipes are pure superscrew dislocations (SSDs). Moreover, these techniques provide accurate descriptions of the detailed structure of the SSDs, including the spatial distribution of the strain fields, the magnitudes of the Burgers vectors, the dislocation senses, and the surface relaxation effects.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.123069