Relations between interaction force and frequency shift in large-amplitude dynamic force microscopy

Large-amplitude dynamic force microscopy based on measuring shifts of the resonance frequency of the force sensor has proved to be a powerful imaging tool. General expressions relating arbitrary interaction forces to resonance frequency shifts are derived using variational methods and Fourier expans...

Full description

Saved in:
Bibliographic Details
Published in:Applied physics letters 1999-07, Vol.75 (3), p.433-435
Main Author: Dürig, U.
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Large-amplitude dynamic force microscopy based on measuring shifts of the resonance frequency of the force sensor has proved to be a powerful imaging tool. General expressions relating arbitrary interaction forces to resonance frequency shifts are derived using variational methods and Fourier expansion of the tip motion. For interactions with a range much shorter than the vibration amplitude, the frequency shift can be expressed in terms of a convolution product involving the interaction force and a weakly divergent kernel. The convolution can be inverted, thus enabling one to recover unequivocally interaction potentials and forces from measured frequency shift data.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.124399