Probing deep interaction potentials with white-noise-driven atomic force microscope cantilevers

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Bibliographic Details
Published in:Applied physics letters 2000-05, Vol.76 (20), p.2952-2954
Main Authors: Koralek, D. O., Heinz, W. F., Antonik, M. D., Baik, A., Hoh, J. H.
Format: Article
Language:English
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ISSN:0003-6951
1077-3118
DOI:10.1063/1.126527