Probing deep interaction potentials with white-noise-driven atomic force microscope cantilevers

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Published in:Applied physics letters 2000-05, Vol.76 (20), p.2952-2954
Main Authors: Koralek, D. O., Heinz, W. F., Antonik, M. D., Baik, A., Hoh, J. H.
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Language:English
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container_title Applied physics letters
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creator Koralek, D. O.
Heinz, W. F.
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source American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list); AIP_美国物理联合会现刊（与NSTL共建）
title Probing deep interaction potentials with white-noise-driven atomic force microscope cantilevers
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