Strain profiles in epitaxial films from x-ray Bragg diffraction phases

We present a versatile and model-independent approach for the analysis of strain distributions in thin-film systems which is based on the x-ray phase retrieval by an iterative Gerchberg–Saxton algorithm. This scheme is used to determine the strain profile across a thin ordered Cu3Au(111) film grown...

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Bibliographic Details
Published in:Applied physics letters 2000-12, Vol.77 (24), p.3929-3931
Main Authors: Vartanyants, I., Ern, C., Donner, W., Dosch, H., Caliebe, W.
Format: Article
Language:English
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Summary:We present a versatile and model-independent approach for the analysis of strain distributions in thin-film systems which is based on the x-ray phase retrieval by an iterative Gerchberg–Saxton algorithm. This scheme is used to determine the strain profile across a thin ordered Cu3Au(111) film grown epitaxially on Al2O3.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.1332100