Magnetic and optical properties of GaMnN magnetic semiconductor

Microcrystalline Ga1−xMnxN samples with Mn content up to x=0.005 were grown by an ammonothermal method and were studied using various techniques. X-ray diffraction showed characteristic diffraction lines for hexagonal GaN phase mixed with a small contribution (

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Bibliographic Details
Published in:Applied physics letters 2001-02, Vol.78 (9), p.1276-1278
Main Authors: Zaja̧c, M., Doradziński, R., Gosk, J., Szczytko, J., Lefeld-Sosnowska, M., Kamińska, M., Twardowski, A., Palczewska, M., Grzanka, E., Gȩbicki, W.
Format: Article
Language:English
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Summary:Microcrystalline Ga1−xMnxN samples with Mn content up to x=0.005 were grown by an ammonothermal method and were studied using various techniques. X-ray diffraction showed characteristic diffraction lines for hexagonal GaN phase mixed with a small contribution (
ISSN:0003-6951
1077-3118
DOI:10.1063/1.1348302