High-resolution imaging of surface acoustic wave scattering

We examine the scattering of surface acoustic waves (SAWs) by single dots, periodic and locally damped two-dimensional dot lattices. Employing the scanning acoustic force microscope, SAW fields are imaged with nanometer resolution. We study the influence of a roughly wavelength-sized single dot on S...

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Bibliographic Details
Published in:Applied physics letters 2001-03, Vol.78 (13), p.1948-1950
Main Authors: Hesjedal, T., Behme, G.
Format: Article
Language:English
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Summary:We examine the scattering of surface acoustic waves (SAWs) by single dots, periodic and locally damped two-dimensional dot lattices. Employing the scanning acoustic force microscope, SAW fields are imaged with nanometer resolution. We study the influence of a roughly wavelength-sized single dot on SAW diffraction. In order to distinguish between forward- and backscattered components, we insonify the dot with the pump and probe beam under 0° and 90°. We furthermore analyze the SAW diffraction by a regular dot array. The wave field appears to be localized around the dots. Adding surface distortions, the regular SAW localization pattern brakes down in the vicinity of the distortion.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.1357453