Stability, resolution, and tip–tip imaging by a dual-probe scanning tunneling microscope

A scanning tunneling microscope (STM) comprised of two mechanically and electrically independent probes is described. This dual-probe STM is capable of atomic resolution imaging with either tip. The two probes have five combined degrees of freedom, which allow them to be positioned together at the s...

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Bibliographic Details
Published in:Review of scientific instruments 2001-12, Vol.72 (12), p.4388-4392
Main Authors: Grube, Holger, Harrison, B. Craig, Jia, Jinfeng, Boland, John J.
Format: Article
Language:English
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Summary:A scanning tunneling microscope (STM) comprised of two mechanically and electrically independent probes is described. This dual-probe STM is capable of atomic resolution imaging with either tip. The two probes have five combined degrees of freedom, which allow them to be positioned together at the same surface location without alterations in tip shape. The positioning capabilities of the microscope are demonstrated by obtaining images with each tip of a unique location on a graphite surface. Stable tip–tip imaging is demonstrated by directly recording the tunneling current between probe tips and the sample.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1416120