Spin-glass and random-field effects in exchange-biased NiFe film on a NiO single-crystal substrate

Magnetization (M) data on a ferromagnetic/antiferromagnetic (FM/AF) sample made of a permalloy thin film sputtered on a thick NiO single-crystal substrate reveal remarkable irreversibilities. The field, temperature (T), and time dependencies of M were measured after the sample was cooled in zero-fie...

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Bibliographic Details
Published in:Journal of applied physics 2002-05, Vol.91 (10), p.7754-7756
Main Authors: Araújo, A. E. P. de, Machado, F. L. A., Rodrigues, A. R., Azevedo, A., de Aguiar, F. M., de Almeida, J. R. L., Rezende, S. M., Egelhoff, W. F.
Format: Article
Language:English
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Summary:Magnetization (M) data on a ferromagnetic/antiferromagnetic (FM/AF) sample made of a permalloy thin film sputtered on a thick NiO single-crystal substrate reveal remarkable irreversibilities. The field, temperature (T), and time dependencies of M were measured after the sample was cooled in zero-field or in the presence of a field, keeping T below the Néel temperature, with the field applied in the plane, either perpendicular or parallel to the anisotropy direction. While the behavior observed in the perpendicular configuration is characteristic of spin glasses, in the parallel configuration it exhibits features of random-field systems. The observed metastabilities and thermal history dependencies are shown to result from frustrations and randomness due to the interface roughness.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.1447496