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Amorphous silicon waveguides for microphotonics

Amorphous silicon a-Si was made by ion irradiation of crystalline silicon with 1×1015 Xe ions cm−2 at 77 K in the 1–4 MeV energy range. Thermal relaxation of the amorphous network at 500 °C for 1 h leads to an amorphous layer with a refractive index of n=3.73, significantly higher than that of cryst...

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Bibliographic Details
Published in:Journal of applied physics 2002-07, Vol.92 (2), p.649-653
Main Authors: de Dood, M. J. A., Polman, A., Zijlstra, T., van der Drift, E. W. J. M.
Format: Article
Language:English
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Summary:Amorphous silicon a-Si was made by ion irradiation of crystalline silicon with 1×1015 Xe ions cm−2 at 77 K in the 1–4 MeV energy range. Thermal relaxation of the amorphous network at 500 °C for 1 h leads to an amorphous layer with a refractive index of n=3.73, significantly higher than that of crystalline silicon (n=3.45 at λ=1.55 μm). a-Si can thus serve as a waveguide core in Si based optical waveguides. Channel waveguides were made by anisotropic etching of a 1.5 μm silicon-on-insulator structure that was partly amorphized. Transmission measurements of these waveguides as function of the amorphous silicon length show that the a-Si part of the waveguides exhibit a modal propagation loss of 70 cm−1 (0.03 dB μm−1) and a bulk propagation loss of 115 cm−1 (0.05 dB μm−1). Losses due to sidewall roughness are estimated, and are negligible compared to the modal loss.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.1486055