Sum-frequency generation microscope for opaque and reflecting samples

We report on the performance of a microscope setup, which has been developed for the imaging of sum-frequency generation (SFG) from reflecting, nontransparent samples. In order to maximize the SFG intensity the sample has to be observed from one side at an angle near 60° with respect to the surface...

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Published in:Review of scientific instruments 2002-09, Vol.73 (9), p.3221-3226
Main Authors: Hoffmann, D. M. P., Kuhnke, K., Kern, K.
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Language:English
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container_end_page 3226
container_issue 9
container_start_page 3221
container_title Review of scientific instruments
container_volume 73
creator Hoffmann, D. M. P.
Kuhnke, K.
Kern, K.
description We report on the performance of a microscope setup, which has been developed for the imaging of sum-frequency generation (SFG) from reflecting, nontransparent samples. In order to maximize the SFG intensity the sample has to be observed from one side at an angle near 60° with respect to the surface normal. The setup is designed (a) to keep focus over the full image field and (b) to compensate for the distortion of the field-of-view, both by means of a blazed grating. In contrast to “specular” SFG spectroscopy, the incident beams reflected from the sample and the generated SF light cannot be separated by angular filtering. In this setup the separation thus relies on spectral filtering only.
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fullrecord <record><control><sourceid>scitation_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_1499757</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>rsi</sourcerecordid><originalsourceid>FETCH-LOGICAL-c365t-45073c73e7c88e30924d159a0ead6836e2ba07ff2d47fc8cd64c0aa02227197f3</originalsourceid><addsrcrecordid>eNqdj0tLAzEUhYMoWKsL_0G2ClNvHpNkllLqAwou1HWIyU0ZmZfJVOi_d2oL7j2bs_k4nI-QawYLBkrcsQWTVaVLfUJmDExVaMXFKZkBCFkoLc05ucj5E6aUjM3I6nXbFjHh1xY7v6Mb7DC5se472tY-9dn3A9LYJ9oPbmKo6wJNGBv0Y91taHbt0GC-JGfRNRmvjj0n7w-rt-VTsX55fF7erwsvVDkWsgQtvBaovTEooOIysLJygC4oIxTyDwc6Rh6kjt74oKQH54Bzrlmlo5iTm8Pu_lqeftgh1a1LO8vA7v0ts0f_ib09sNnX46_S_-DvPv2BdghR_ABcomnG</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Sum-frequency generation microscope for opaque and reflecting samples</title><source>American Institute of Physics (AIP) Publications</source><source>American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)</source><creator>Hoffmann, D. M. P. ; Kuhnke, K. ; Kern, K.</creator><creatorcontrib>Hoffmann, D. M. P. ; Kuhnke, K. ; Kern, K.</creatorcontrib><description>We report on the performance of a microscope setup, which has been developed for the imaging of sum-frequency generation (SFG) from reflecting, nontransparent samples. In order to maximize the SFG intensity the sample has to be observed from one side at an angle near 60° with respect to the surface normal. The setup is designed (a) to keep focus over the full image field and (b) to compensate for the distortion of the field-of-view, both by means of a blazed grating. In contrast to “specular” SFG spectroscopy, the incident beams reflected from the sample and the generated SF light cannot be separated by angular filtering. In this setup the separation thus relies on spectral filtering only.</description><identifier>ISSN: 0034-6748</identifier><identifier>EISSN: 1089-7623</identifier><identifier>DOI: 10.1063/1.1499757</identifier><identifier>CODEN: RSINAK</identifier><language>eng</language><ispartof>Review of scientific instruments, 2002-09, Vol.73 (9), p.3221-3226</ispartof><rights>American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c365t-45073c73e7c88e30924d159a0ead6836e2ba07ff2d47fc8cd64c0aa02227197f3</citedby><cites>FETCH-LOGICAL-c365t-45073c73e7c88e30924d159a0ead6836e2ba07ff2d47fc8cd64c0aa02227197f3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/rsi/article-lookup/doi/10.1063/1.1499757$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,780,782,784,795,27924,27925,76255</link.rule.ids></links><search><creatorcontrib>Hoffmann, D. M. P.</creatorcontrib><creatorcontrib>Kuhnke, K.</creatorcontrib><creatorcontrib>Kern, K.</creatorcontrib><title>Sum-frequency generation microscope for opaque and reflecting samples</title><title>Review of scientific instruments</title><description>We report on the performance of a microscope setup, which has been developed for the imaging of sum-frequency generation (SFG) from reflecting, nontransparent samples. In order to maximize the SFG intensity the sample has to be observed from one side at an angle near 60° with respect to the surface normal. The setup is designed (a) to keep focus over the full image field and (b) to compensate for the distortion of the field-of-view, both by means of a blazed grating. In contrast to “specular” SFG spectroscopy, the incident beams reflected from the sample and the generated SF light cannot be separated by angular filtering. In this setup the separation thus relies on spectral filtering only.</description><issn>0034-6748</issn><issn>1089-7623</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2002</creationdate><recordtype>article</recordtype><recordid>eNqdj0tLAzEUhYMoWKsL_0G2ClNvHpNkllLqAwou1HWIyU0ZmZfJVOi_d2oL7j2bs_k4nI-QawYLBkrcsQWTVaVLfUJmDExVaMXFKZkBCFkoLc05ucj5E6aUjM3I6nXbFjHh1xY7v6Mb7DC5se472tY-9dn3A9LYJ9oPbmKo6wJNGBv0Y91taHbt0GC-JGfRNRmvjj0n7w-rt-VTsX55fF7erwsvVDkWsgQtvBaovTEooOIysLJygC4oIxTyDwc6Rh6kjt74oKQH54Bzrlmlo5iTm8Pu_lqeftgh1a1LO8vA7v0ts0f_ib09sNnX46_S_-DvPv2BdghR_ABcomnG</recordid><startdate>200209</startdate><enddate>200209</enddate><creator>Hoffmann, D. M. P.</creator><creator>Kuhnke, K.</creator><creator>Kern, K.</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>200209</creationdate><title>Sum-frequency generation microscope for opaque and reflecting samples</title><author>Hoffmann, D. M. P. ; Kuhnke, K. ; Kern, K.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c365t-45073c73e7c88e30924d159a0ead6836e2ba07ff2d47fc8cd64c0aa02227197f3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2002</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Hoffmann, D. M. P.</creatorcontrib><creatorcontrib>Kuhnke, K.</creatorcontrib><creatorcontrib>Kern, K.</creatorcontrib><collection>CrossRef</collection><jtitle>Review of scientific instruments</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Hoffmann, D. M. P.</au><au>Kuhnke, K.</au><au>Kern, K.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Sum-frequency generation microscope for opaque and reflecting samples</atitle><jtitle>Review of scientific instruments</jtitle><date>2002-09</date><risdate>2002</risdate><volume>73</volume><issue>9</issue><spage>3221</spage><epage>3226</epage><pages>3221-3226</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><coden>RSINAK</coden><abstract>We report on the performance of a microscope setup, which has been developed for the imaging of sum-frequency generation (SFG) from reflecting, nontransparent samples. In order to maximize the SFG intensity the sample has to be observed from one side at an angle near 60° with respect to the surface normal. The setup is designed (a) to keep focus over the full image field and (b) to compensate for the distortion of the field-of-view, both by means of a blazed grating. In contrast to “specular” SFG spectroscopy, the incident beams reflected from the sample and the generated SF light cannot be separated by angular filtering. In this setup the separation thus relies on spectral filtering only.</abstract><doi>10.1063/1.1499757</doi><tpages>6</tpages></addata></record>
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1089-7623
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title Sum-frequency generation microscope for opaque and reflecting samples
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T19%3A13%3A25IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-scitation_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Sum-frequency%20generation%20microscope%20for%20opaque%20and%20reflecting%20samples&rft.jtitle=Review%20of%20scientific%20instruments&rft.au=Hoffmann,%20D.%20M.%20P.&rft.date=2002-09&rft.volume=73&rft.issue=9&rft.spage=3221&rft.epage=3226&rft.pages=3221-3226&rft.issn=0034-6748&rft.eissn=1089-7623&rft.coden=RSINAK&rft_id=info:doi/10.1063/1.1499757&rft_dat=%3Cscitation_cross%3Ersi%3C/scitation_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c365t-45073c73e7c88e30924d159a0ead6836e2ba07ff2d47fc8cd64c0aa02227197f3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true