Rapid imaging of nanotubes on insulating substrates

We demonstrate the use of field-emission scanning electron microscopy for rapid imaging of small-diameter carbon nanotubes on insulating SiO2 substrates. The image contrast stems from local potential differences between the nanotube and substrate and is insensitive to surface roughness and defects....

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Published in:Applied physics letters 2002-09, Vol.81 (13), p.2454-2456
Main Authors: Brintlinger, T., Chen, Yung-Fu, Dürkop, T., Cobas, Enrique, Fuhrer, M. S., Barry, John D., Melngailis, John
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Language:English
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container_end_page 2456
container_issue 13
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container_title Applied physics letters
container_volume 81
creator Brintlinger, T.
Chen, Yung-Fu
Dürkop, T.
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description We demonstrate the use of field-emission scanning electron microscopy for rapid imaging of small-diameter carbon nanotubes on insulating SiO2 substrates. The image contrast stems from local potential differences between the nanotube and substrate and is insensitive to surface roughness and defects. This technique may also be used as a probe of the electrical connectivity of small structures without external leads.
doi_str_mv 10.1063/1.1509113
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title Rapid imaging of nanotubes on insulating substrates
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