Electrical isolation of ZnO by ion bombardment

The evolution of sheet resistance of n-type single-crystal wurtzite ZnO epilayers exposed to bombardment with MeV H1, Li7, O16, and Si28 ions at room temperature is studied in situ. We demonstrate that sheet resistance of ZnO can be increased by about 7 orders of magnitude as a result of ion irradia...

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Bibliographic Details
Published in:Applied physics letters 2002-10, Vol.81 (18), p.3350-3352
Main Authors: Kucheyev, S. O., Deenapanray, P. N. K., Jagadish, C., Williams, J. S., Yano, Mitsuaki, Koike, Kazuto, Sasa, Shigehiko, Inoue, Masataka, Ogata, Ken-ichi
Format: Article
Language:English
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Summary:The evolution of sheet resistance of n-type single-crystal wurtzite ZnO epilayers exposed to bombardment with MeV H1, Li7, O16, and Si28 ions at room temperature is studied in situ. We demonstrate that sheet resistance of ZnO can be increased by about 7 orders of magnitude as a result of ion irradiation. Due to extremely efficient dynamic annealing in ZnO, the ion doses needed for isolation of this material are about 2 orders of magnitude larger than corresponding doses in the case of another wide-bandgap semiconductor, GaN. Results also show that the ion doses necessary for electrical isolation close-to-inversely depend on the number of ion-beam-generated atomic displacements. However, in all the cases studied, defect-induced electrical isolation of ZnO is unstable to rapid thermal annealing at temperatures above ∼300 °C.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.1518560