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Scanning vector Hall probe microscope
We present a scanning vector Hall probe microscope for imaging the entire magnetic field vector in close proximity to magnetic and superconducting samples. The microscope combines a large scanned area and a high space resolution of the magnetic field vector measured. A special feature of the equipme...
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| Published in: | Review of scientific instruments 2003-12, Vol.74 (12), p.5105-5110 |
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| Main Authors: | , , , , , |
| Format: | Article |
| Language: | English |
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| cited_by | cdi_FETCH-LOGICAL-c297t-553d0feadbd74a2e11d145054ebf5ee018c0f9ebd3a835a269c2027be95301113 |
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| cites | cdi_FETCH-LOGICAL-c297t-553d0feadbd74a2e11d145054ebf5ee018c0f9ebd3a835a269c2027be95301113 |
| container_end_page | 5110 |
| container_issue | 12 |
| container_start_page | 5105 |
| container_title | Review of scientific instruments |
| container_volume | 74 |
| creator | Fedor, J. Cambel, V. Gregušová, D. Hanzelka, P. Dérer, J. Volko, J. |
| description | We present a scanning vector Hall probe microscope for imaging the entire magnetic field vector in close proximity to magnetic and superconducting samples. The microscope combines a large scanned area and a high space resolution of the magnetic field vector measured. A special feature of the equipment is a vacuum-tight sample space connected with a moving system via a flexible metal bellows. The microscope is based on a vector Hall sensor that consists of three separate Hall probes of an active area
5×5 μ
m
2
,
patterned on three sides of a GaAs pyramid. The top of the pyramid serves as a tunneling contact and helps to control the sensor–sample separation. The sensor and the sample are placed in a helium cryostat with a temperature control in the range 10–300 K. The sensor scans an area up to
5×5
mm
2
in the whole temperature interval with a spatial resolution
∼5 μ
m
. |
| doi_str_mv | 10.1063/1.1623004 |
| format | article |
| fullrecord | <record><control><sourceid>scitation_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_1623004</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>rsi</sourcerecordid><originalsourceid>FETCH-LOGICAL-c297t-553d0feadbd74a2e11d145054ebf5ee018c0f9ebd3a835a269c2027be95301113</originalsourceid><addsrcrecordid>eNp9z01Lw0AQBuBFFKzVg_8gFw8KqTP7kY-jFGuFggf1vGx2ZyWSZsNuKPjvTWnRg-BchoGHd3gZu0ZYIBTiHhdYcAEgT9gMoarzcjpP2QxAyLwoZXXOLlL6hGkU4ozdvFrT923_ke3IjiFma9N12RBDQ9m2tTEkGwa6ZGfedImujnvO3lePb8t1vnl5el4-bHLL63LMlRIOPBnXuFIaTogOpQIlqfGKCLCy4GtqnDCVUIYXteXAy4ZqJQARxZzdHnL3j1Mkr4fYbk380gh630-jPvab7N3BJtuOZmxD_4N3If5CPTj_H_6b_A0VlV0C</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Scanning vector Hall probe microscope</title><source>American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)</source><source>American Institute of Physics</source><creator>Fedor, J. ; Cambel, V. ; Gregušová, D. ; Hanzelka, P. ; Dérer, J. ; Volko, J.</creator><creatorcontrib>Fedor, J. ; Cambel, V. ; Gregušová, D. ; Hanzelka, P. ; Dérer, J. ; Volko, J.</creatorcontrib><description>We present a scanning vector Hall probe microscope for imaging the entire magnetic field vector in close proximity to magnetic and superconducting samples. The microscope combines a large scanned area and a high space resolution of the magnetic field vector measured. A special feature of the equipment is a vacuum-tight sample space connected with a moving system via a flexible metal bellows. The microscope is based on a vector Hall sensor that consists of three separate Hall probes of an active area
5×5 μ
m
2
,
patterned on three sides of a GaAs pyramid. The top of the pyramid serves as a tunneling contact and helps to control the sensor–sample separation. The sensor and the sample are placed in a helium cryostat with a temperature control in the range 10–300 K. The sensor scans an area up to
5×5
mm
2
in the whole temperature interval with a spatial resolution
∼5 μ
m
.</description><identifier>ISSN: 0034-6748</identifier><identifier>EISSN: 1089-7623</identifier><identifier>DOI: 10.1063/1.1623004</identifier><identifier>CODEN: RSINAK</identifier><language>eng</language><ispartof>Review of scientific instruments, 2003-12, Vol.74 (12), p.5105-5110</ispartof><rights>American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c297t-553d0feadbd74a2e11d145054ebf5ee018c0f9ebd3a835a269c2027be95301113</citedby><cites>FETCH-LOGICAL-c297t-553d0feadbd74a2e11d145054ebf5ee018c0f9ebd3a835a269c2027be95301113</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/rsi/article-lookup/doi/10.1063/1.1623004$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,776,778,780,791,27903,27904,76129</link.rule.ids></links><search><creatorcontrib>Fedor, J.</creatorcontrib><creatorcontrib>Cambel, V.</creatorcontrib><creatorcontrib>Gregušová, D.</creatorcontrib><creatorcontrib>Hanzelka, P.</creatorcontrib><creatorcontrib>Dérer, J.</creatorcontrib><creatorcontrib>Volko, J.</creatorcontrib><title>Scanning vector Hall probe microscope</title><title>Review of scientific instruments</title><description>We present a scanning vector Hall probe microscope for imaging the entire magnetic field vector in close proximity to magnetic and superconducting samples. The microscope combines a large scanned area and a high space resolution of the magnetic field vector measured. A special feature of the equipment is a vacuum-tight sample space connected with a moving system via a flexible metal bellows. The microscope is based on a vector Hall sensor that consists of three separate Hall probes of an active area
5×5 μ
m
2
,
patterned on three sides of a GaAs pyramid. The top of the pyramid serves as a tunneling contact and helps to control the sensor–sample separation. The sensor and the sample are placed in a helium cryostat with a temperature control in the range 10–300 K. The sensor scans an area up to
5×5
mm
2
in the whole temperature interval with a spatial resolution
∼5 μ
m
.</description><issn>0034-6748</issn><issn>1089-7623</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2003</creationdate><recordtype>article</recordtype><recordid>eNp9z01Lw0AQBuBFFKzVg_8gFw8KqTP7kY-jFGuFggf1vGx2ZyWSZsNuKPjvTWnRg-BchoGHd3gZu0ZYIBTiHhdYcAEgT9gMoarzcjpP2QxAyLwoZXXOLlL6hGkU4ozdvFrT923_ke3IjiFma9N12RBDQ9m2tTEkGwa6ZGfedImujnvO3lePb8t1vnl5el4-bHLL63LMlRIOPBnXuFIaTogOpQIlqfGKCLCy4GtqnDCVUIYXteXAy4ZqJQARxZzdHnL3j1Mkr4fYbk380gh630-jPvab7N3BJtuOZmxD_4N3If5CPTj_H_6b_A0VlV0C</recordid><startdate>200312</startdate><enddate>200312</enddate><creator>Fedor, J.</creator><creator>Cambel, V.</creator><creator>Gregušová, D.</creator><creator>Hanzelka, P.</creator><creator>Dérer, J.</creator><creator>Volko, J.</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>200312</creationdate><title>Scanning vector Hall probe microscope</title><author>Fedor, J. ; Cambel, V. ; Gregušová, D. ; Hanzelka, P. ; Dérer, J. ; Volko, J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c297t-553d0feadbd74a2e11d145054ebf5ee018c0f9ebd3a835a269c2027be95301113</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2003</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Fedor, J.</creatorcontrib><creatorcontrib>Cambel, V.</creatorcontrib><creatorcontrib>Gregušová, D.</creatorcontrib><creatorcontrib>Hanzelka, P.</creatorcontrib><creatorcontrib>Dérer, J.</creatorcontrib><creatorcontrib>Volko, J.</creatorcontrib><collection>CrossRef</collection><jtitle>Review of scientific instruments</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Fedor, J.</au><au>Cambel, V.</au><au>Gregušová, D.</au><au>Hanzelka, P.</au><au>Dérer, J.</au><au>Volko, J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Scanning vector Hall probe microscope</atitle><jtitle>Review of scientific instruments</jtitle><date>2003-12</date><risdate>2003</risdate><volume>74</volume><issue>12</issue><spage>5105</spage><epage>5110</epage><pages>5105-5110</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><coden>RSINAK</coden><abstract>We present a scanning vector Hall probe microscope for imaging the entire magnetic field vector in close proximity to magnetic and superconducting samples. The microscope combines a large scanned area and a high space resolution of the magnetic field vector measured. A special feature of the equipment is a vacuum-tight sample space connected with a moving system via a flexible metal bellows. The microscope is based on a vector Hall sensor that consists of three separate Hall probes of an active area
5×5 μ
m
2
,
patterned on three sides of a GaAs pyramid. The top of the pyramid serves as a tunneling contact and helps to control the sensor–sample separation. The sensor and the sample are placed in a helium cryostat with a temperature control in the range 10–300 K. The sensor scans an area up to
5×5
mm
2
in the whole temperature interval with a spatial resolution
∼5 μ
m
.</abstract><doi>10.1063/1.1623004</doi><tpages>6</tpages></addata></record> |
| fulltext | fulltext |
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| ispartof | Review of scientific instruments, 2003-12, Vol.74 (12), p.5105-5110 |
| issn | 0034-6748 1089-7623 |
| language | eng |
| recordid | cdi_crossref_primary_10_1063_1_1623004 |
| source | American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list); American Institute of Physics |
| title | Scanning vector Hall probe microscope |
| url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-27T00%3A54%3A36IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-scitation_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Scanning%20vector%20Hall%20probe%20microscope&rft.jtitle=Review%20of%20scientific%20instruments&rft.au=Fedor,%20J.&rft.date=2003-12&rft.volume=74&rft.issue=12&rft.spage=5105&rft.epage=5110&rft.pages=5105-5110&rft.issn=0034-6748&rft.eissn=1089-7623&rft.coden=RSINAK&rft_id=info:doi/10.1063/1.1623004&rft_dat=%3Cscitation_cross%3Ersi%3C/scitation_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c297t-553d0feadbd74a2e11d145054ebf5ee018c0f9ebd3a835a269c2027be95301113%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |