Atomic Spectral Tables for the Chandra X-ray Observatory. Part II. Si VI–Si XII

Tables of critically compiled wavelengths, energy levels, line classifications, and transition probabilities are given for spectra of ionized silicon (Si VI–Si XII) in the region 25–170 Å. These tables provide data of interest for the Emission Line Project in support of analyses of astronomical data...

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Published in:Journal of physical and chemical reference data 2004-06, Vol.33 (2), p.471-494
Main Authors: Podobedova, L. I., Kelleher, D. E., Reader, J., Wiese, W. L.
Format: Article
Language:English
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Nuclear energy
Observatories
Spectrum analysis
X-rays
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container_title Journal of physical and chemical reference data
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creator Podobedova, L. I.
Kelleher, D. E.
Reader, J.
Wiese, W. L.
description Tables of critically compiled wavelengths, energy levels, line classifications, and transition probabilities are given for spectra of ionized silicon (Si VI–Si XII) in the region 25–170 Å. These tables provide data of interest for the Emission Line Project in support of analyses of astronomical data from the Chandra X-ray Observatory. They will also be useful for the diagnostics of plasmas encountered in fusion energy research. The transition probabilities were obtained mainly from recent sophisticated calculations carried out with complex computer codes.
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subjects Nuclear energy
Observatories
Spectrum analysis
X-rays
title Atomic Spectral Tables for the Chandra X-ray Observatory. Part II. Si VI–Si XII
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