Cathodoluminescence of defects in sintered tin oxide

Cathodoluminescence (CL) in the scanning electron microscope (SEM) has been used to investigate the luminescence mechanisms in tin oxide. Sintered material prepared from high purity powder has been found to show a strong dependence of the CL emission on the thermal treatments applied during sample p...

Full description

Saved in:
Bibliographic Details
Published in:Journal of applied physics 2004-03, Vol.95 (6), p.3027-3030
Main Authors: Maestre, D., Cremades, A., Piqueras, J.
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c328t-e86c95327803ec5469c4a66470cf25d7b26538b061d59d174c71aef830f83d5b3
cites cdi_FETCH-LOGICAL-c328t-e86c95327803ec5469c4a66470cf25d7b26538b061d59d174c71aef830f83d5b3
container_end_page 3030
container_issue 6
container_start_page 3027
container_title Journal of applied physics
container_volume 95
creator Maestre, D.
Cremades, A.
Piqueras, J.
description Cathodoluminescence (CL) in the scanning electron microscope (SEM) has been used to investigate the luminescence mechanisms in tin oxide. Sintered material prepared from high purity powder has been found to show a strong dependence of the CL emission on the thermal treatments applied during sample preparation. SEM images show the presence of nano and microcrystalline grains. The correlation of the grain size and morphology with the optical emission is analyzed by CL microscopy and spectroscopy. The main emission bands appear centered at about 2.58, 2.25, and 1.94 eV depending on the sintering treatment. CL images reveal that the 2.25 and the 2.58 eV bands are associated at specific crystal faces. The evolution of the luminescence bands with mechanical milling shows a complex evolution of the 1.94 and 2.58 eV emissions which is explained by formation and recovery of defects during milling.
doi_str_mv 10.1063/1.1647267
format article
fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_1647267</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1063_1_1647267</sourcerecordid><originalsourceid>FETCH-LOGICAL-c328t-e86c95327803ec5469c4a66470cf25d7b26538b061d59d174c71aef830f83d5b3</originalsourceid><addsrcrecordid>eNotj0tLxDAUhYMoWEcX_oNsXXS8N2leSym-YMCNrkua3GBlppGkgv57K87icDibj_Mxdo2wRdDyFreoOyO0OWENgnWtUQpOWQMgsLXOuHN2UesHAKKVrmFd75f3HPP-6zDNVAPNgXhOPFKisFQ-zbxO80KFIl_Wkb-nSJfsLPl9patjb9jbw_1r_9TuXh6f-7tdG6SwS0tWB6ekMBYkBdVpFzqv13sQklDRjEIraUfQGJWLaLpg0FOyEtZENcoNu_nnhpJrLZSGzzIdfPkZEIY_3QGHo678BeCkRgY</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Cathodoluminescence of defects in sintered tin oxide</title><source>American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)</source><creator>Maestre, D. ; Cremades, A. ; Piqueras, J.</creator><creatorcontrib>Maestre, D. ; Cremades, A. ; Piqueras, J.</creatorcontrib><description>Cathodoluminescence (CL) in the scanning electron microscope (SEM) has been used to investigate the luminescence mechanisms in tin oxide. Sintered material prepared from high purity powder has been found to show a strong dependence of the CL emission on the thermal treatments applied during sample preparation. SEM images show the presence of nano and microcrystalline grains. The correlation of the grain size and morphology with the optical emission is analyzed by CL microscopy and spectroscopy. The main emission bands appear centered at about 2.58, 2.25, and 1.94 eV depending on the sintering treatment. CL images reveal that the 2.25 and the 2.58 eV bands are associated at specific crystal faces. The evolution of the luminescence bands with mechanical milling shows a complex evolution of the 1.94 and 2.58 eV emissions which is explained by formation and recovery of defects during milling.</description><identifier>ISSN: 0021-8979</identifier><identifier>EISSN: 1089-7550</identifier><identifier>DOI: 10.1063/1.1647267</identifier><language>eng</language><ispartof>Journal of applied physics, 2004-03, Vol.95 (6), p.3027-3030</ispartof><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c328t-e86c95327803ec5469c4a66470cf25d7b26538b061d59d174c71aef830f83d5b3</citedby><cites>FETCH-LOGICAL-c328t-e86c95327803ec5469c4a66470cf25d7b26538b061d59d174c71aef830f83d5b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Maestre, D.</creatorcontrib><creatorcontrib>Cremades, A.</creatorcontrib><creatorcontrib>Piqueras, J.</creatorcontrib><title>Cathodoluminescence of defects in sintered tin oxide</title><title>Journal of applied physics</title><description>Cathodoluminescence (CL) in the scanning electron microscope (SEM) has been used to investigate the luminescence mechanisms in tin oxide. Sintered material prepared from high purity powder has been found to show a strong dependence of the CL emission on the thermal treatments applied during sample preparation. SEM images show the presence of nano and microcrystalline grains. The correlation of the grain size and morphology with the optical emission is analyzed by CL microscopy and spectroscopy. The main emission bands appear centered at about 2.58, 2.25, and 1.94 eV depending on the sintering treatment. CL images reveal that the 2.25 and the 2.58 eV bands are associated at specific crystal faces. The evolution of the luminescence bands with mechanical milling shows a complex evolution of the 1.94 and 2.58 eV emissions which is explained by formation and recovery of defects during milling.</description><issn>0021-8979</issn><issn>1089-7550</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2004</creationdate><recordtype>article</recordtype><recordid>eNotj0tLxDAUhYMoWEcX_oNsXXS8N2leSym-YMCNrkua3GBlppGkgv57K87icDibj_Mxdo2wRdDyFreoOyO0OWENgnWtUQpOWQMgsLXOuHN2UesHAKKVrmFd75f3HPP-6zDNVAPNgXhOPFKisFQ-zbxO80KFIl_Wkb-nSJfsLPl9patjb9jbw_1r_9TuXh6f-7tdG6SwS0tWB6ekMBYkBdVpFzqv13sQklDRjEIraUfQGJWLaLpg0FOyEtZENcoNu_nnhpJrLZSGzzIdfPkZEIY_3QGHo678BeCkRgY</recordid><startdate>20040315</startdate><enddate>20040315</enddate><creator>Maestre, D.</creator><creator>Cremades, A.</creator><creator>Piqueras, J.</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20040315</creationdate><title>Cathodoluminescence of defects in sintered tin oxide</title><author>Maestre, D. ; Cremades, A. ; Piqueras, J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c328t-e86c95327803ec5469c4a66470cf25d7b26538b061d59d174c71aef830f83d5b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2004</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Maestre, D.</creatorcontrib><creatorcontrib>Cremades, A.</creatorcontrib><creatorcontrib>Piqueras, J.</creatorcontrib><collection>CrossRef</collection><jtitle>Journal of applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Maestre, D.</au><au>Cremades, A.</au><au>Piqueras, J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Cathodoluminescence of defects in sintered tin oxide</atitle><jtitle>Journal of applied physics</jtitle><date>2004-03-15</date><risdate>2004</risdate><volume>95</volume><issue>6</issue><spage>3027</spage><epage>3030</epage><pages>3027-3030</pages><issn>0021-8979</issn><eissn>1089-7550</eissn><abstract>Cathodoluminescence (CL) in the scanning electron microscope (SEM) has been used to investigate the luminescence mechanisms in tin oxide. Sintered material prepared from high purity powder has been found to show a strong dependence of the CL emission on the thermal treatments applied during sample preparation. SEM images show the presence of nano and microcrystalline grains. The correlation of the grain size and morphology with the optical emission is analyzed by CL microscopy and spectroscopy. The main emission bands appear centered at about 2.58, 2.25, and 1.94 eV depending on the sintering treatment. CL images reveal that the 2.25 and the 2.58 eV bands are associated at specific crystal faces. The evolution of the luminescence bands with mechanical milling shows a complex evolution of the 1.94 and 2.58 eV emissions which is explained by formation and recovery of defects during milling.</abstract><doi>10.1063/1.1647267</doi><tpages>4</tpages><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier ISSN: 0021-8979
ispartof Journal of applied physics, 2004-03, Vol.95 (6), p.3027-3030
issn 0021-8979
1089-7550
language eng
recordid cdi_crossref_primary_10_1063_1_1647267
source American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)
title Cathodoluminescence of defects in sintered tin oxide
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-24T16%3A45%3A16IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Cathodoluminescence%20of%20defects%20in%20sintered%20tin%20oxide&rft.jtitle=Journal%20of%20applied%20physics&rft.au=Maestre,%20D.&rft.date=2004-03-15&rft.volume=95&rft.issue=6&rft.spage=3027&rft.epage=3030&rft.pages=3027-3030&rft.issn=0021-8979&rft.eissn=1089-7550&rft_id=info:doi/10.1063/1.1647267&rft_dat=%3Ccrossref%3E10_1063_1_1647267%3C/crossref%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c328t-e86c95327803ec5469c4a66470cf25d7b26538b061d59d174c71aef830f83d5b3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true