PRODUCTION AND ANNEALING OF LATTICE DISORDER IN SILICON BY 200-keV BORON IONS

We have investigated the lattice disorder produced in Si by 200-keV B implantations using the standard channeling technique. We found the disorder production strongly temperature-dependent from about −85°C to room temperature. The annealing of the residual disorder present after such a B implantatio...

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Bibliographic Details
Published in:Applied physics letters 1969-01, Vol.15 (9), p.308-310
Main Authors: Westmoreland, J. E., Mayer, J. W., Eisen, F. H., Welch, B.
Format: Article
Language:English
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Summary:We have investigated the lattice disorder produced in Si by 200-keV B implantations using the standard channeling technique. We found the disorder production strongly temperature-dependent from about −85°C to room temperature. The annealing of the residual disorder present after such a B implantation takes place at higher temperatures. Our results indicate that the nature of the lattice disorder produced in Si by low dose ion implantation depends on the mass of the ion implanted.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.1653010