Observation of Xerographic Electrostatic Latent Images with a Scanning Electron Microscope

Xerographic latent images produced by the optical exposure of electrostatically charged photoconductive films have been studied with a scanning electron microscope. This technique provides a tool for studying the structure of the latent image independently of the development process.

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Bibliographic Details
Published in:Applied physics letters 1971-01, Vol.19 (8), p.277-278
Main Authors: Fritz, G. F., Hoesterey, D. C., Brady, L. E.
Format: Article
Language:English
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Description
Summary:Xerographic latent images produced by the optical exposure of electrostatically charged photoconductive films have been studied with a scanning electron microscope. This technique provides a tool for studying the structure of the latent image independently of the development process.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.1653916