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Noncritical'' phase matching in optical waveguides

Phase matching of nonlinear three-wave optical processes in optical waveguides is shown to be possible with the use of only zero-order TE and TM modes, such that the phase-match condition is made insensitive to waveguide thickness over a limited region. This is accomplished by adjusting the phase sh...

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Bibliographic Details
Published in:Applied physics letters 1973-01, Vol.22 (4), p.143-145
Main Authors: Burns, W.K., Andrews, R.A.
Format: Article
Language:English
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Summary:Phase matching of nonlinear three-wave optical processes in optical waveguides is shown to be possible with the use of only zero-order TE and TM modes, such that the phase-match condition is made insensitive to waveguide thickness over a limited region. This is accomplished by adjusting the phase shifts on total internal reflection for lowest-order modes, near cutoff, in a thin nearly symmetric waveguide. This ``noncritical'' situation eases the requirements on waveguide fabrication. Limitations due to bulk dispersion, waveguide asymmetry, and surface scattering losses are discussed.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.1654588