A Graphite Crystal Polarimeter for Stellar X‐Ray Astronomy

The first crystal x‐ray polarimeter to be used for x‐ray astronomy is described. Polarization is measured by modulation of the x rays diffracted at an average 45° glancing angle from large, curved graphite crystal panels as these rotate about an axis parallel to the incident x‐ray flux. Arrangement...

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Bibliographic Details
Published in:Review of scientific instruments 1972-07, Vol.43 (7), p.967-976
Main Authors: Weisskopf, M. C., Berthelsdorf, R., Epstein, G., Linke, R., Mitchell, D., Novick, R., Wolff, R. S.
Format: Article
Language:English
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Summary:The first crystal x‐ray polarimeter to be used for x‐ray astronomy is described. Polarization is measured by modulation of the x rays diffracted at an average 45° glancing angle from large, curved graphite crystal panels as these rotate about an axis parallel to the incident x‐ray flux. Arrangement of the crystal panels, the design of the detector, and the signal‐processing circuitry were optimized to minimize systematic effects produced by off‐axis pointing of the rocket and cosmic ray induced events. The in‐flight performance of the instrument in relation to the observed background signal is discussed.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1685840