Current density mapping and pinhole imaging in magnetic tunnel junctions via scanning magnetic microscopy

We have applied a magnetoresistive microscopy technique to the imaging of current densities and pinhole formation in magnetic tunnel junction devices. In this work, we demonstrate how the magnetic field distribution at the surface of the device can be used to understand the flow of current within th...

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Published in:Applied physics letters 2004-04, Vol.84 (15), p.2937-2939
Main Authors: Schrag, B. D., Liu, Xiaoyong, Shen, Weifeng, Xiao, Gang
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Language:English
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container_title Applied physics letters
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creator Schrag, B. D.
Liu, Xiaoyong
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Xiao, Gang
description We have applied a magnetoresistive microscopy technique to the imaging of current densities and pinhole formation in magnetic tunnel junction devices. In this work, we demonstrate how the magnetic field distribution at the surface of the device can be used to understand the flow of current within the junction itself. By imaging the current-induced fields before and after pinhole formation in several different junctions, we find that many junctions exhibit an unexpectedly complicated current distribution after high-voltage-induced breakdown. Further, we have seen that pinhole locations can be correlated with current inhomogeneities observed before junction breakdown. Finally, we present the results of finite-element simulations which are in good agreement with experimental results.
doi_str_mv 10.1063/1.1695194
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title Current density mapping and pinhole imaging in magnetic tunnel junctions via scanning magnetic microscopy
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