A two-dimensional analysis of spurious compressional wave excitation by thickness-shear-mode resonators

In this article we investigate the spurious excitation of compressional waves by thickness-shear-mode resonators, which are commonly used for chemical sensing and viscosity sensing. In particular, we consider the excitation mechanism due to the nonuniform shear displacement present at the sensitive...

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Published in:Journal of applied physics 2004-05, Vol.95 (9), p.4989-4995
Main Authors: Beigelbeck, Roman, Jakoby, Bernhard
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Language:English
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description In this article we investigate the spurious excitation of compressional waves by thickness-shear-mode resonators, which are commonly used for chemical sensing and viscosity sensing. In particular, we consider the excitation mechanism due to the nonuniform shear displacement present at the sensitive surface of the resonator. To illustrate the basic mechanism we analytically develop a general solution for a two-dimensional model describing the displacement and the pressure distribution in the liquid obtained in terms of Fourier integrals. We discuss these solutions and derive a useful approximation for the far field representing said compressional modes. We finally illustrate the results considering a practical example and associated numerical results.
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title A two-dimensional analysis of spurious compressional wave excitation by thickness-shear-mode resonators
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