Compression of Ti3Si0.5Ge0.5C2 to 53 GPa

Using a synchrotron radiation source and a diamond anvil cell, we measured the pressure dependence of the lattice parameters of a polycrystalline Ti3Si0.5Ge0.5C2 sample. Up to a pressure of 53 GPa, no phase transformations were observed. As for the isostructural hexagonal Ti3SiC2, the compressibilit...

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Bibliographic Details
Published in:Applied physics letters 2004-04, Vol.84 (15), p.2799-2801
Main Authors: Manoun, Bouchaib, Liermann, H. P., Gulve, R. P., Saxena, S. K., Ganguly, A., Barsoum, M. W., Zha, C. S.
Format: Article
Language:English
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Summary:Using a synchrotron radiation source and a diamond anvil cell, we measured the pressure dependence of the lattice parameters of a polycrystalline Ti3Si0.5Ge0.5C2 sample. Up to a pressure of 53 GPa, no phase transformations were observed. As for the isostructural hexagonal Ti3SiC2, the compressibility along the c axis was greater than along a. The bulk modulus is 183±4 GPa with a pressure derivative of 3.4±0.2. This work shows that the replacement of Si by Ge in Ti3SiC2 results in a systematic decrease in the bulk moduli.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.1699477