Low-loss photonic crystal defect waveguides in InP

We have fabricated high-quality planar photonic crystal defect waveguides in InP/InGaAsP material. Using Fourier analysis of the Fabry-Pérot fringes obtained in transmission, we derive the propagation losses. Values as small as 1.8 dB/mm for waveguides consisting of three rows of missing holes (W3)...

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Bibliographic Details
Published in:Applied physics letters 2004-05, Vol.84 (18), p.3588-3590
Main Authors: Kotlyar, M. V., Karle, T., Settle, M. D., O’Faolain, L., Krauss, T. F.
Format: Article
Language:English
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Summary:We have fabricated high-quality planar photonic crystal defect waveguides in InP/InGaAsP material. Using Fourier analysis of the Fabry-Pérot fringes obtained in transmission, we derive the propagation losses. Values as small as 1.8 dB/mm for waveguides consisting of three rows of missing holes (W3) were measured. We believe that the reduction in losses is due to the high quality of etching carried out using a high beam voltage–current ratio regime of chemically assisted ion-beam etching.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.1737487