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INTERPRETATION OF TUNNEL EMISSION AND CAPACITANCE MEASUREMENTS IN THE PRESENCE OF DIELECTRIC FILM-THICKNESS FLUCTUATIONS

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Bibliographic Details
Published in:Applied physics letters 1966-06, Vol.8 (12), p.328-331
Main Author: Crowell, C. R.
Format: Article
Language:English
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ISSN:0003-6951
1077-3118
DOI:10.1063/1.1754462