Loading…
INTERPRETATION OF TUNNEL EMISSION AND CAPACITANCE MEASUREMENTS IN THE PRESENCE OF DIELECTRIC FILM-THICKNESS FLUCTUATIONS
Saved in:
Published in: | Applied physics letters 1966-06, Vol.8 (12), p.328-331 |
---|---|
Main Author: | |
Format: | Article |
Language: | English |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Summary: | |
---|---|
ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.1754462 |